Effect of Operating Temperature on Performance of Obliquely Deposited Bi, Sb and Bi-Sb Semimetal Thin Film Laser Detectors

Raid A. Ismail; Walid K. Hamudi; Afnan K. Al-Makadusi

doi:10.31900/ijl.v3iA.152

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Published: Jun 18, 2004

DOI: https://doi.org/10.31900/ijl.v3iA.152

Raid A. Ismail

Walid K. Hamudi

Afnan K. Al-Makadusi

Abstract

Obliquely deposited (70o) Bi, Sb, and Bi-Sb alloy thin films have been prepared by thermal
resistive technique. Structural properties of these films were studied using XRD. Their resistance and
voltage responsivity for Nd:YAG and CO2 laser pulses have been recorded as function of operating
temperature between 10 oC and 120 oC. It was found that the maximum responsivity for these detectors
can be obtained at 75 oC. On the other hand, the dependence of responsivity on the width of detectors was
investigated.

How to Cite

[1]

R. A. Ismail, W. K. Hamudi, and A. K. Al-Makadusi, “Effect of Operating Temperature on Performance of Obliquely Deposited Bi, Sb and Bi-Sb Semimetal Thin Film Laser Detectors”, IJL, vol. 3, no. A, pp. 11–17, Jun. 2004, doi: 10.31900/ijl.v3iA.152.

Issue

Vol. 3 No. A (2004): .

Section

Articles

How to Cite

[1]

R. A. Ismail, W. K. Hamudi, and A. K. Al-Makadusi, “Effect of Operating Temperature on Performance of Obliquely Deposited Bi, Sb and Bi-Sb Semimetal Thin Film Laser Detectors”, IJL, vol. 3, no. A, pp. 11–17, Jun. 2004, doi: 10.31900/ijl.v3iA.152.